研究目的
Investigating the stability and efficiency of Sn/Pb-based perovskite solar cells with a coherent 2D/3D interface.
研究成果
The introduction of NAP into CH3NH3Sn0.5Pb0.5IxCl3-x perovskite films facilitated the formation of a unique 2D/3D hybrid structure, leading to solar cells with over 12% power conversion efficiency and exceptional stability. This represents a significant advancement in the development of stable Sn-based perovskite solar cells.
研究不足
The study could not fully elucidate the mechanism by which NAP slows down the oxidation of Sn2+ to Sn4+, indicating a need for further investigation into the role of NAP in perovskite stability.
1：Experimental Design and Method Selection
The study introduced N-(3-aminopropyl)-2-pyrrolidinone (NAP) into CH3NH3Sn0.5Pb0.5IxCl3-x thin films to form a 2D/3D hybrid perovskite structure. The interaction between the carbonyl group in NAP and Sn2+/Pb2+ was leveraged to form vertically oriented 2D layered perovskite.
2：Sample Selection and Data Sources
Perovskite films were prepared by spin-coating precursor solutions on PEDOT:PSS substrates, followed by vacuum annealing. Different concentrations of NAP were added to study its effect on film morphology and device performance.
3：List of Experimental Equipment and Materials
SEM (Zeiss EVO 18), GIWAXS (Xeuss 2.0 with MetalJet-D2 X-ray source), TEM (JEM-2100F), XPS (ESCALAB 250Xi), FTIR (Thermo Scientific Nicolet iS 50), solar simulator (Enlitech SS-F5), EQE measurement system (Enlitech QE-R3011).
4：Experimental Procedures and Operational Workflow
Perovskite solutions were prepared and spin-coated on PEDOT:PSS substrates, followed by annealing. Devices were fabricated with the architecture ITO/PEDOT:PSS/perovskite/PCBM/Phen-NaDPO/Ag. Characterization included SEM, GIWAXS, TEM, XPS, FTIR, J-V measurements, EQE, and stability tests.
5：Data Analysis Methods
Data analysis included performance metrics from J-V curves, EQE spectra integration, and stability assessments under ambient and illuminated conditions.
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TEM
JEM-2100F
JEOL
Transmission electron microscopy for nanostructure analysis
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XPS
ESCALAB 250Xi
Thermo Fisher Scientific
X-ray photoelectron spectroscopy for chemical state analysis
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FTIR
Nicolet iS 50
Thermo Scientific
Fourier transform infrared spectroscopy for molecular interaction analysis
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SEM
EVO 18
Zeiss
Scanning electron microscopy for film morphology analysis
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GIWAXS
Xeuss 2.0
Xenocs
Grazing-incidence wide-angle X-ray scattering for crystal structure analysis
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Solar Simulator
SS-F5
Enlitech
Simulating solar illumination for device testing
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EQE Measurement System
QE-R3011
Enlitech
External quantum efficiency measurement
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