研究目的
Investigating the manufacturing route for printed OPV device arrays based on conventional architecture and using inkjet printing technology over an industrial platform.
研究成果
The research successfully demonstrated the upscaling of the manufacturing process for printed OPVs from laboratory to an industrial scale using inkjet technology. The developed OPV stacks were manufactured on standard flexible plastic substrate, under ambient atmosphere, and free of conservative materials such as ITO. The most optimal results showed electrical characteristics of: Voc 0.48 V, Isc 0.33 mA/cm2, FF 37.2%, PCE 0.18%, and manufacturing yield more than 70%.
研究不足
The performance of the devices was not optimal when compared to literature, and the manufacturing yield decreased with increasing device size. The research was conducted under ambient atmosphere without encapsulation, which may affect device performance.
1:Experimental Design and Method Selection:
The research demonstrates the manufacturing route for printed OPV device arrays using inkjet printing technology over an industrial platform.
2:Sample Selection and Data Sources:
Commercially available electronically functional inks were carefully selected and implemented.
3:List of Experimental Equipment and Materials:
Includes inkjet printers (DMP-2831, DMP-3000), functional inks (Ag, ZnO, P3HT:PCBM, PEDOT:PSS), and substrates (PEN film).
4:Experimental Procedures and Operational Workflow:
The deposition of functional layers was performed under normal atmospheric conditions, with specific curing and sintering steps for each layer.
5:Data Analysis Methods:
Electrical characterization was performed using an AM1.5G light source, Agilent E4980A LCR meter, and Keithley 2636A source meter.
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CLEVIOS? F HC Solar
F HC Solar
Heraeus group
PEDOT:PSS-based semitransparent top anode electrode ink.
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Agilent E4980A
E4980A
Agilent Technologies
Precision digital LCR meter for electrical characterization.
E4980A/E4980AL Precision LCR Meter
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DMP-2831
DMP-2831
Fujifilm Dimatix
Inkjet printer used for depositing different layers for the OPV device.
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DMP-3000
DMP-3000
Fujifilm Dimatix
Industrial inkjet printer used for upscaling the deposition process.
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silverjet DGP LT-15C
DGP LT-15C
Advanced Nano Products/Sigma Aldrich
Nanoparticle-based Ag ink used for the bottom cathode electrode.
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Nanograde N11 Jet
N11 Jet
Avantama AG
Nanoparticle-based ZnO ink used for the ETL layer.
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P3HT:PCBM
P3HT:PCBM
Osilla Ltd
Photoactive BHJ layer material.
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Teonex Q65HA
Q65HA
DuPont Teijin
Flexible PEN substrate for inkjet printing.
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Keithley 2636A
2636A
Keithley Instruments
Source meter for electrical characterization.
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Veeco Dektak 150
Dektak 150
Veeco Instruments, Inc.
Surface profilometer for layer topology analysis.
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