研究目的
Investigating the effects of bandgap grading on the performance of Cu(In, Ga)Se2 thin-film solar cells by comparing two different precursor types.
研究成果
Appropriate Eg grading in a CIGSe layer with a wider Eg on the back surface can result in improved performance by reducing the formation of Ga-related defects and defect clusters.
研究不足
The study is limited to two types of precursor stacking orders and does not explore other potential configurations or materials. The selenization process conditions are fixed, which may not be optimal for all precursor types.
1：Experimental Design and Method Selection:
Two precursor types were employed for the CIGSe absorber layer: Mo/Cu
2：75Ga25/In/Ga2Se3 (CIGSe-1) and Mo/Cu/In/Ga2Se3 (CIGSe-2). The precursors were selenized in a nearly sealed quartz furnace. Sample Selection and Data Sources:
The samples were characterized using SEM, a solar simulator, EQE measurements, AS, STEM-EDS, and KPFM.
3：List of Experimental Equipment and Materials:
SEM apparatus (Hitachi Co., model S-4800), solar simulator (Newport Co., model 94022A), SR 830 DSP lock-in amplifier system (McScience Co.), E4980A LCR meter (Agilent Co.), QUANTAX 200 system (Bruker Co.), and a commercial AFM instrument (Nanofocus Inc., n-Tracer).
4：Experimental Procedures and Operational Workflow:
The precursors were deposited on a Mo layer, selenized, and then annealed. The remaining layers of the device were added subsequently.
5：Data Analysis Methods:
The defect energy levels were determined using AS, and the surface potential characteristics were analyzed using KPFM.
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QUANTAX 200 system
QUANTAX 200
Bruker Co.
Analyzing the compositions of the absorber layers and mapping the elemental distributions
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SEM apparatus
S-4800
Hitachi Co.
Acquiring surface and cross-sectional images of the absorber layers
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E4980A LCR meter
E4980A
Agilent Co.
Probing frequencies from 20 Hz to 2 MHz for AS measurements
E4980A/E4980AL Precision LCR Meter
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Solar simulator
94022A
Newport Co.
Measuring current–voltage characteristics under simulated air mass spectrum of 1.5 global (AM 1.5G) and 100 mW/cm2 (1 sun) illumination
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SR 830 DSP lock-in amplifier system
SR 830
McScience Co.
Obtaining EQE values
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AFM instrument
n-Tracer
Nanofocus Inc.
Characterizing the electrical properties of the absorber surfaces
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