研究目的
Investigating the enhancement of optical Kerr nonlinearity in graphene/Si hybrid waveguides for nonlinear all-optical signal processing.
研究成果
The incorporation of single layer graphene significantly enhances the Kerr nonlinearity and nonlinear FOM in silicon-based waveguides, making them suitable for nonlinear photonic applications in the telecommunication wavelength window.
研究不足
The study is limited by the relatively weak evanescent fields in the graphene/Si hybrid structure and the potential for further optimization in the field strength interaction between the silicon waveguide and graphene.
1:Experimental Design and Method Selection:
The study involves the fabrication of single-mode silicon waveguides and graphene/Si hybrid waveguides, followed by the measurement of their optical Kerr nonlinearities using self-phase modulation experiments under picosecond pulses.
2:Sample Selection and Data Sources:
Single-mode silicon waveguides with a width of 500 nm, a height of 340 nm, and a length of 3.5 mm are fabricated on a SOI wafer. Monolayer graphene is transferred onto the waveguide.
3:5 mm are fabricated on a SOI wafer. Monolayer graphene is transferred onto the waveguide. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: JEOL-6300 e-beam lithography system, Oxford PlasmaPro 100 for ICP etching, PriTel’s FFL series picosecond ?ber lasers, optical spectrum analyzer (Yokogawa AQ6370D), frequency-resolved optical gating (FROG) instrument (Coherent Solutions HR150).
4:0). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The waveguides are pumped by picosecond ?ber lasers, and the transmission spectra are measured to study the SPM process. The temporal characteristics of the pulse are measured using a FROG instrument.
5:Data Analysis Methods:
The nonlinear Schr€odinger equation (NLSE) with the split-step Fourier method is used to simulate the on-chip SPM process.
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JEOL-6300
6300
JEOL
e-beam lithography system for patterning Si waveguides
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Oxford PlasmaPro 100
PlasmaPro 100
Oxford
inductively coupled plasma (ICP) etching for pattern transfer
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Yokogawa AQ6370D
AQ6370D
Yokogawa
optical spectrum analyzer for monitoring the input spectrum
-
PriTel’s FFL series
FFL
PriTel
picosecond ?ber lasers for pumping the waveguides
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Coherent Solutions HR150
HR150
Coherent Solutions
frequency-resolved optical gating (FROG) instrument for measuring temporal characteristics of the pulse
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