研究目的
Investigating the enhancement of Si solar cell working efficiency through the application of a nano-porous thermal cooling layer (TCL) with water as a cooling agent.
研究成果
The application of a nano-porous TCL with water as a cooling agent significantly reduces the working temperature of Si solar cells, leading to an enhancement in their working efficiency. The study demonstrates the potential of this method for improving solar cell performance in extreme summer conditions.
研究不足
The study focuses on the cooling efficiency of TCL with water as a cooling agent under specific conditions. The scalability and long-term durability of the TCL in real-world applications are not discussed.
1:Experimental Design and Method Selection:
The study involved the use of a nano-porous TCL beneath a Si solar cell to reduce its working temperature and enhance efficiency. The TCL's properties were analyzed using XRD, Raman, SEM, FESEM, and BET techniques.
2:Sample Selection and Data Sources:
Polycrystalline silicon (pc-Si) solar cells were used, with the TCL's thickness and water concentration varied to study their effects on cooling efficiency.
3:List of Experimental Equipment and Materials:
Equipment included SmartLab XRD of Rigaku, Raman Spectrometer of HORIBA Jobin Yvon, 'Zeiss EVO-18' SEM, 'FEI: Nova Nano' FESEM, Quantachrome Instruments for BET analysis, thermal imager (TESTO 875-1i), and 2400-Keithley Electrometer for I–V characteristics.
4:Experimental Procedures and Operational Workflow:
The TCL was placed beneath the solar cell, and its cooling effect was studied under controlled illumination. Water was introduced into the TCL to study its cooling efficiency.
5:Data Analysis Methods:
The cooling efficiency was analyzed based on temperature reduction and efficiency enhancement of the solar cell.
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SEM
EVO-18
Zeiss
Surface morphology analysis of TCL
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FESEM
Nova Nano
FEI
In-depth structure examination of carbon particles
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Thermal imager
TESTO 875-1i
TESTO
Heat flow and temperature gradient study
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Electrometer
2400-Keithley
Keithley
I–V characteristics measurement
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Raman Spectrometer
LABRAM HR 800 JY
HORIBA Jobin Yvon
Structural analysis of TCL
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SmartLab XRD
Rigaku
Crystallographic analysis of the materials
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BET analyzer
Quantachrome Instruments version 3.01
Quantachrome Instruments
Pore analysis of TCL
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