研究目的
Demonstrating efficient, polarized monolithic white semipolar (20–21) InGaN light-emitting diodes (LEDs) grown on high crystal quality 4-inch (20–21) GaN/sapphire template and its application to visible light communication.
研究成果
Efficient, polarized monolithic white semipolar LEDs on large area (20–21) GaN/sapphire templates were demonstrated, showing high output power, white emission spectrum, and high polarization ratio. A high modulation bandwidth of 660 MHz was achieved, indicating potential for backlighting in LCDs and VLC applications.
研究不足
The study focuses on the demonstration of monolithic white semipolar LEDs on sapphire substrates, with potential areas for optimization in epitaxial structure and device design to further improve modulation speed for VLC applications.
1:Experimental Design and Method Selection:
Growth of semipolar (20–21) InGaN LEDs on 4-inch (20–21) GaN/sapphire templates using metal-organic chemical vapor deposition (MOCVD). Characterization by atom probe tomography (APT).
2:Sample Selection and Data Sources:
4-inch unintentionally doped (20–21) GaN templates obtained after coalescing adjacent crystals each grown at an inclined c-axis on a patterned (22–43) sapphire substrate.
3:List of Experimental Equipment and Materials:
MOCVD system, APT, FEI Helios 600 dual beam FIB instrument, LEAP 3000X HR instrument, IVAS? software, network analyzer (PNA-X N5247A), high-speed micro-probe (ACP40-GS-250), silicon PIN photodetector (UPD-200-UP), amplifiers (SHF 88 and SHF 88 A).
4:Experimental Procedures and Operational Workflow:
Growth of epitaxial structure, fabrication of LEDs and μLEDs, characterization of optical and electrical properties, frequency response measurement.
5:Data Analysis Methods:
Analysis of In composition distribution by APT, measurement of output power-current-voltage characteristics, electroluminescence spectrum, polarization ratio, and modulation bandwidth.
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FEI Helios 600 dual beam FIB instrument
Helios 600
FEI
Preparation of samples for APT
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MOCVD
Growth of semipolar (20–21) InGaN LEDs
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APT
Characterization of In composition distribution
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LEAP 3000X HR instrument
3000X HR
Cameca
Atom probe tomography
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IVAS? software
APT 3D reconstruction
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Network analyzer
PNA-X N5247A
Measurement of small-signal frequency response
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High-speed micro-probe
ACP40-GS-250
Application of AC signal to LEDs
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Silicon PIN photodetector
UPD-200-UP
Collection of light from LEDs
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Amplifiers
SHF 88 and SHF 88 A
Amplification of signal
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