研究目的
Demonstrating a new polarized Raman spectroscopy analyzation technique of orientation Raman imaging for characterizing the alignment of single-walled carbon nanotube (SWCNT) films over large areas.
研究成果
Polarized Raman imaging provides a comprehensive and efficient method to characterize the alignment in large areas of SWCNT films, offering a significant improvement over traditional single-point measurements. This technique enables the visualization of alignment quality and distribution across the film, facilitating the development of scalable aligned SWCNT films.
研究不足
The major limiting factors for polarized Raman imaging are time and resolution of area imaged. Large area scans (>1 mm2) may experience focus drift at the edges due to natural temperature fluctuations and stage movement.
1：Experimental Design and Method Selection:
Utilized polarized Raman spectroscopy with rotating optics to image large areas of SWCNT films.
2：Sample Selection and Data Sources:
SWCNT films fabricated via floating evaporative self-assembly (FESA) on silicon substrates.
3：List of Experimental Equipment and Materials:
Thermo Scientific DXR2xi Raman Imaging Microscope, 532-nm laser, 50×/
4：5 BD LMPlan FI Olympus objective, SparkFun Stepoko motorized rotational stage. Experimental Procedures and Operational Workflow:
Collected polarized Raman images with VV and HH configurations, normalized to the silicon peak, and calculated optical anisotropy for each pixel to form an orientation image.
5：Data Analysis Methods:
Used a circular normal distribution model for SWCNT alignment and calculated optical anisotropy from the ratio of VV/HH peak intensities.
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