1：Experimental Design and Method Selection:

The study used a diode-pumped solid-state ultrafast laser processing system to pattern Ag nanopaste ?lms. The methodology involved adjusting laser processing parameters such as laser ?uence, pulse repetition rate, and scanning speed to investigate the ablation threshold, line widths, depths, and electrical properties of the ?lms.

2：Sample Selection and Data Sources:

Screen-printed silver nanopaste ?lms on glass substrates were used. The ?lms were characterized before and after laser processing using a 3D laser scanning confocal microscope and SEM with EDS.

3：List of Experimental Equipment and Materials:

The equipment included an ultrafast laser processing system (Advanced Optowave Corporation model AOPico 532-5-100), a galvanometer system (Raylase AG model MS-II-14), a 3D laser scanning confocal microscope (Kyence VK-X200 series), and a four-point probe instrument (QUATEK CH-5601Y).

4：Experimental Procedures and Operational Workflow:

The laser beam was scanned along line patterns on the Ag ?lms with varying laser ?uences, pulse repetition rates, and scanning speeds. The ablation threshold, line widths, depths, and sheet resistances were measured and analyzed.

5：Data Analysis Methods:

The ablation threshold and line widths were calculated using equations based on laser energy and ?uence. Sheet resistances were measured directly using a four-point probe instrument.