研究目的
Investigating the effects of Pb and Li co-doped NiOx as hole transport materials on the performance of inverted planar perovskite solar cells.
研究成果
The Pb and Li co-doping strategy effectively improves the work function of NiOx to match with perovskite valence band energy level and increases the conductivity of NiOx. This leads to enhanced performance of inverted planar PSCs, with an efficiency improvement from 15.40% to 17.02%. The study demonstrates the potential of co-doped NiOx as an efficient hole transport layer in PSCs.
研究不足
The study focuses on the effects of Pb and Li co-doping on NiOx films and their application in PSCs. The scalability and long-term stability of the co-doped NiOx films in PSCs are not extensively discussed.
1：Experimental Design and Method Selection:
The study involves the preparation of undoped and doped NiOx films by a solution-based method, followed by the fabrication of PSCs with these films as hole transport layers. The performance of these devices is characterized under standard test conditions.
2：Sample Selection and Data Sources:
The samples include PSCs with undoped NiOx, Pb-doped NiOx, and Pb and Li co-doped NiOx as hole transport layers. Data is collected from J-V characteristics, SEM, AFM, UPS, UV-vis spectrum, XPS, and SPM measurements.
3：List of Experimental Equipment and Materials:
Nickel acetate tetrahydrate, ethanolamine, ethanol, lead acetate, lithium acetate, FTO substrates, perovskite materials, PCBM, BCP, and Ag electrodes are used. Instruments include spin coater, SEM, AFM, UPS, UV-vis spectrophotometer, XPS, and SPM.
4：Experimental Procedures and Operational Workflow:
The NiOx films are prepared by spin-coating precursor solutions on FTO substrates. The PSCs are fabricated with a structure of FTO/NiOx or doped NiOx/PVK/PCBM/BCP/Ag. The devices are then characterized for their photovoltaic performance.
5：Data Analysis Methods:
The performance of the PSCs is analyzed based on J-V characteristics. The morphology, energy level structure, and conductivity of the NiOx films are analyzed using SEM, AFM, UPS, UV-vis spectrum, XPS, and SPM.
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