研究目的
To achieve a low dielectric constant for nonporous poly(imide siloxane) films with mechanical and thermal robustness by using a symmetric disiloxane-linked alkyl diamine, BATMS.
研究成果
The incorporation of minimized disiloxane segments via BATMS is an effective approach to achieve low dielectric PI films with robust thermostability and improved moisture resistance, making them promising for microelectronic applications.
研究不足
The study focuses on thermoplastic poly(imide siloxane) films and does not explore cross-linked copolymers. The mechanical properties decrease with increasing BATMS content, and PI-90 was fragile and unable to generate mechanical test results.
1:Experimental Design and Method Selection:
The study involved the synthesis of poly(imide siloxane) films using BATMS and ODA with ODPA through a two-step thermal imidization process.
2:Sample Selection and Data Sources:
The films were prepared with varying molar percentages of BATMS to study its effect on the properties of the resulting polymers.
3:List of Experimental Equipment and Materials:
Instruments used include a Bruker DRX 400 spectrometer for NMR, Instron universal tester for mechanical testing, PerkinElmer TGA-2 for thermal analysis, DMA Q800V
4:22 for dynamic mechanical analysis, Bede XRD Di system for WAXD, Hitachi F-4600 fluorescence spectrometer, Shimadzu UV-visible spectrophotometer UV-2450, and Novocontrol Dielectric Spectrometer for dielectric measurements. Experimental Procedures and Operational Workflow:
The films were synthesized, cast onto glass plates, thermally imidized, and then characterized for their mechanical, thermal, optical, and dielectric properties.
5:Data Analysis Methods:
The data were analyzed to understand the relationship between the BATMS content and the properties of the films.
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Shimadzu UV-visible spectrophotometer
UV-2450
Shimadzu
Recording ultraviolet visible spectra of the polymer films
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Bruker DRX 400 spectrometer
DRX 400
Bruker
Recording 1H NMR spectra
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PerkinElmer TGA-2
TGA-2
PerkinElmer
Conducting thermogravimetric analysis measurements
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Hitachi F-4600 fluorescence spectrometer
F-4600
Hitachi
Recording fluorescence spectra of copolymer films
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Instron universal tester
1122
Instron
Studying the stress-strain behavior of the PI film samples
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DMA Q800V20.22
Q800V20.22 Build 41
DMA
Conducting dynamic mechanical analysis measurements
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Bede XRD Di system
XRD Di
Bede
Performing wide-angle X-ray diffraction measurement
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Novocontrol Dielectric Spectrometer
CONCEPT 40
Novocontrol
Performing dielectric spectroscopy measurements
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