研究目的
Investigating the feasibility of fabricating phosphorescent top-emitting OLEDs using a solution process with a simple OLED structure and replacing indium tin oxide electrode by a low-cost reflective aluminum electrode.
研究成果
The study demonstrates the feasibility of fabricating phosphorescent top-emitting OLEDs using a solution process with a simple structure and a low-cost reflective aluminum electrode. Optical properties are relatively well-optimized, showing a low emission shift and angle dependency, indicating control over microcavity effects.
研究不足
The current efficiency of top-emitting OLEDs is lower than that of bottom-emitting OLEDs. The study demonstrates feasibility but indicates room for improvement in efficiency and performance.
1：Experimental Design and Method Selection:
The study compares the performances of top-emitting and bottom-emitting OLEDs based on the same emissive material (iridium complex).
2：Sample Selection and Data Sources:
OLEDs are built on 25 by 25 mm2 glass substrates, covered by an indium tin oxide (ITO) layer for BOLEDs and by a 140 nm thick aluminum layer for TOLEDs.
3：List of Experimental Equipment and Materials:
Includes zinc oxide nanoparticles, polyethylenimine-ethoxylated (PEIE), 1,3,5-tris(N-phenylbenzimidazol-2-yl)benzene (TPBi), iridium complexes (Ir(mppy)3 and Ir(ppy)3), poly(N-vinylcarbazole) (PVK), and others.
4：Experimental Procedures and Operational Workflow:
Describes the fabrication process, including cleaning, spin-coating, annealing, and thermal evaporation steps.
5：Data Analysis Methods:
Electroluminescence spectrum and current density-voltage-luminance (JVL) characteristics are measured using specific equipment.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
tris[2-(phenylpyridinato-C2, N]iridium(III)
Ir(ppy)3
Sigma-Aldrich
Used as an emitter in the OLED.
-
Andor SR-500i spectrometer
SR-500i
Andor
Used for measuring the electroluminescence spectrum.
-
Keithley 2400
2400
Keithley
Used as a Source Measure Unit (SMU) for recording current density-voltage-luminance (JVL) characteristics.
-
zinc oxide nanoparticles
Genes’ink
Used as a layer in the OLED fabrication process.
-
polyethylenimine-ethoxylated
Sigma-Aldrich
Used as electron injection material.
-
1,3,5-tris(N-phenylbenzimidazol-2-yl)benzene
Lumtec
Used as hole blocking material.
-
tris[2-(p-tolyl)pyridine]iridium(III)
Ir(mppy)3
Lumtec
Used as an emitter in the OLED.
-
poly(N-vinylcarbazole)
PVK
Used as a host for iridium complexes.
-
登录查看剩余6件设备及参数对照表
查看全部
