研究目的
Demonstrating optical sampling of pseudo random microwave signals with sinc-shaped Nyquist pulse sequences in an integrated silicon photonics platform.
研究成果
The demonstration of an electrical on-chip all optical sampling of a pseudo random microwave signal with a depletion-type silicon MZM with a high extinction ratio of 28 dB was successful. By exploiting the convolution of the microwave signal with a three-line rectangular frequency comb directly in the chip, the achievable sampling rate was three times the RF bandwidth of the used chip. This new sampling technique might be used for next generation on-chip microwave photonic signal processing.
研究不足
Due to experimental and device limitations, the usable RF bandwidth of the chip was 7 GHz, corresponding to a sampling rate of only 21 GSa/s.
1：Experimental Design and Method Selection:
The experiment utilized an electronic-photonic, co-integrated depletion type silicon intensity modulator for sampling microwave signals with sinc-shaped Nyquist pulse sequences.
2：Sample Selection and Data Sources:
Pseudo random microwave signals were used as the signal under test (SUT).
3：List of Experimental Equipment and Materials:
The setup included a LiNbO3 Mach-Zehnder modulator, an Anritsu MP1800A bit pattern generator (BPG), erbium doped fiber amplifier (EDFA), and an Agilent 86100C sampling oscilloscope among others.
4：Experimental Procedures and Operational Workflow:
The microwave signal was encoded to an optical carrier, amplified, and then injected into nano waveguides via a fiber array and on-chip grating couplers. The output was collected, amplified, and visualized.
5：Data Analysis Methods:
The detected signal was visualized using a sampling oscilloscope, and the output spectrum was monitored by an optical spectrum analyzer.
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