研究目的
Investigating the damage mechanism and process of metal multi-layer dielectric gratings induced by ps-pulsed laser.
研究成果
The gratings damage was induced by thermal ablation action, with less stress action involved. The damage occurred near locations of strong laser field and high temperature in gratings. The study concludes with a focus on improving the gratings damage threshold for future applications.
研究不足
The study focuses on ps-pulsed laser-induced damage, and the findings may not directly apply to fs or ns-pulsed laser scenarios. The damage threshold of the prepared gratings is noted as too low for application, indicating a need for improvement.
1：Experimental Design and Method Selection:
The study involved preparing a multi-layer grating on a gold film and testing its laser damage threshold and morphologies using an 800 nm wavelength, 450 ps laser pulse. Theoretical calculations included temperature field and stress field analysis considering the ionization process of dielectric layers.
2：Sample Selection and Data Sources:
A high reflection mirror was fabricated on a fused silica substrate with a gold layer and five alternate dielectric layers (HfO2 and SiO2).
3：2). List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: A CPA Ti: sapphire laser, an achromatic lens, an attenuator, an energy meter, and a charge-coupled device (CCD) were used.
4：Experimental Procedures and Operational Workflow:
Laser damage experiments were performed with a near-Gaussian profile, S-polarized pulse, focused on the sample. Damage was monitored in situ.
5：Data Analysis Methods:
The damage threshold was fitted by extrapolating the damage probability versus energy density curve to zero damage probability.
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