研究目的
To increase the performance of solar cell devices by proposing an alternative method for making CZTS ?lms using microwave technology and doctor blade printing.
研究成果
The study successfully demonstrated the fabrication of CZTS films using a rapid and promising microwave technique combined with doctor blade printing, achieving a desirable quality for use in solar cell devices with an optical band gap of about 1.5 eV.
研究不足
The study mentions the need for further research on the controlled growth of CZTS thin layers and the influence of secondary phases like CTS on the solar cell coefficient.
1:Experimental Design and Method Selection:
The microwave-assisted process and doctor blade printing were used to prepare Cu2ZnSnS4 ?lms.
2:Sample Selection and Data Sources:
Ink solution consisting of copper, zinc acetate, tin chloride and thiourea as copper, zinc, tin and sulfur precursors, respectively, was used. Ethylene glycol was used as a non-toxic solvent.
3:List of Experimental Equipment and Materials:
Microwave oven, soda lime silica glass substrates, X-ray di?raction analysis, Raman spectroscopy, Fourier transform infrared spectroscopy, thermal gravimetric analysis, transmittance spectroscopy, ?eld emission scanning electron microscopy (FESEM), energy dispersive X-ray, and UV–Vis spectrophotometry.
4:Experimental Procedures and Operational Workflow:
The CZTS ink was prepared using microwave heating for 10 min. The CZTS layers were printed on soda lime silica glass substrates and heat treated at 150, 200, 250, 300, and 350°C.
5:Data Analysis Methods:
The microstructure, phase analysis, morphology, optical properties, and absorption ratio of the samples were evaluated.
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Microwave oven
700 W and 2.45 GHz
Used for heating the CZTS ink solution.
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X-ray di?raction analysis
Used for phase analysis of the synthesized samples.
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Raman spectroscopy
Jobin-Yvon HR800
Used to confirm the purity of the CZTS films.
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Fourier transform infrared spectroscopy
Perkin Elmer 1760-X
Used to examine the bonding of the organic ligand.
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Field emission scanning electron microscopy
HITACHI S-4160
Used to characterize the morphology and elemental composition of the films.
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Energy dispersive X-ray analyzer
Used with FESEM to analyze the elemental composition.
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Thermogravimetric analysis
TA Instruments TGA 2950 system
Used to study the thermal behavior of the CZTS films.
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UV–Vis spectrophotometer
Shimadzu, UV-3600
Used to investigate the optical properties of the CZTS films.
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Dynamic light scattering
Nano ZS (red badge) ZEN 3600
Used to report the characteristic of the distribution of particles according to intensity.
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