研究目的
Investigating a new approach towards improved light outcoupling in OLEDs by integration of scattering electrodes as internal scattering layers.
研究成果
The integration of scattering electrodes into OLEDs via a three-step process significantly enhances light outcoupling, as evidenced by a 30% increase in luminous efficiency and a 27% increase in EQE. This approach presents a promising direction for improving OLED performance.
研究不足
The study focuses on green-emitting vacuum-processed OLEDs, and the applicability to other types of OLEDs or different emission colors is not explored. The process may require optimization for large-scale production.
1：Experimental Design and Method Selection:
A three-step process including electro-spray deposition of a sacrificial material, thin metal-layer deposition, and elution of the sacrificial material was used to fabricate scattering metal structures for cavity OLEDs.
2：Sample Selection and Data Sources:
Green-emitting vacuum-processed OLEDs were used to test the integration of scattering electrodes.
3：List of Experimental Equipment and Materials:
Electro-spray deposition setup, thermal evaporator for metal-layer deposition, and solvents for elution.
4：Experimental Procedures and Operational Workflow:
Fabrication of scattering electrodes via the three-step process and their integration into OLEDs, followed by measurement of luminous efficiency and EQE.
5：Data Analysis Methods:
Comparison of luminous efficiency and EQE between OLEDs with and without scattering electrodes.
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Zeiss Supra 40 VP field emission scanning electron microscope
Supra 40 VP
Zeiss
Used for SEM imaging.
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LAMBDA 1050 UV/Vis/NIR Spectrophotometer
LAMBDA 1050
Perkin Elmer
Used for measuring diffuse reflectance.
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PicoPlus syringe pump
Harvard Apparatus
Used for pumping the spray solution with a constant flow-rate.
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HCP 1.25M-12500 high-voltage power supply
HCP 1.25M-12500
FuG
Used to apply voltage for electrospray deposition.
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K. J. Lesker spectros evaporator
K. J. Lesker
Used for thermal evaporation of metal layers.
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SPM SmartSPM-1000
SmartSPM-1000
AIST-NT
Used for AFM measurements.
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