1：Experimental Design and Method Selection:

The study involved the fabrication of bilayered thin films using pulsed laser deposition (PLD) with different growth sequences (P-S and S-P) on Pt/Si substrates. The structural, ferroelectric, and magnetic properties were analyzed using X-ray diffraction, Raman scattering, X-ray photoelectron spectroscopy, dielectric permittivity measurements, ferroelectric hysteresis loops, leakage current measurements, and magnetic hysteresis curves.

2：Sample Selection and Data Sources:

The samples were prepared with compositions of (K, Na, Li)NbO3-CoZnFe2O4 (P-S) and CoZnFe2O4-(K, Na, Li)NbO3 (S-P).

3：List of Experimental Equipment and Materials:

PLD KrF laser excimer of 248 nm, X-ray diffractometer (Bruker D2 Phasor), Micro Raman spectrometer (Jobin Yvon Horibra LABRAM-HR), Omicron energy analyzer for XPS, Radiant Premier Precision II System for leakage current measurements, PSM1735 Impedance Analyzer for dielectric measurements, 7-Tesla SQUID Vibrating sample magnetometer for magnetic properties.

4：Experimental Procedures and Operational Workflow:

Films were deposited at an oxygen pressure of 330–350 mTorr for 20 min for each layer at a substrate temperature of 700 °C. After deposition, films were cooled to room temperature under ambient oxygen pressure.

5：Data Analysis Methods:

Structural analysis was performed using XRD and Raman spectroscopy. Chemical states were analyzed using XPS. Electrical properties were measured using impedance and leakage current measurements. Magnetic properties were analyzed using SQUID magnetometry.