研究目的
To overcome the fundamental limits of material and physical properties in deep ultraviolet light emitting diodes (DUV LEDs) by integrating them with a multiplicative photoelectric converter (MPC) to significantly enhance device performance.
研究成果
The monolithic integration of DUV LED with an MPC structure achieves a very high WPE of 21.6%, demonstrating a 60-fold enhancement compared to conventional DUV LED. This enhancement is attributed to the improved hole injection efficiency by the in-situ MPC structure operating under Geiger mode multiplication. The strategy shows promise for improving the efficiency of future light emitters.
研究不足
The study focuses on the integration of DUV LED with MPC to improve hole injection efficiency and WPE, but further optimization and studies are needed to address potential areas for improvement and application constraints.
1:Experimental Design and Method Selection:
The MPC-DUV LED includes an in-situ epitaxial growth of intrinsic GaN (i-GaN) and n-type GaN on the p-type GaN of conventional DUV LED (C-DUV LED). The MPC-DUV LEDs were fabricated by conducting mesa etching in Cl2 gas and depositing Ti/Al/Ti/Au metal stack on the n-AlGaN layer and n-GaN layer using e-beam evaporation.
2:Sample Selection and Data Sources:
The C-DUV LED and MPC-DUV LED were grown by metal-organic chemical vapor deposition (MOCVD) system on the c-plane sapphire substrate.
3:List of Experimental Equipment and Materials:
MOCVD system, Cl2 gas for mesa etching, e-beam evaporation for metal deposition, Ti/Al/Ti/Au metal stack.
4:Experimental Procedures and Operational Workflow:
After the thermal annealing process of C-DUV LED, i-GaN and n-type GaN were grown at 780℃. The MPC-DUV LEDs were then fabricated by mesa etching and metal deposition.
5:0℃. The MPC-DUV LEDs were then fabricated by mesa etching and metal deposition.
Data Analysis Methods:
5. Data Analysis Methods: The photoelectric measurements were conducted using a photodetector model OSI Optoelectronics UV-100. The current-voltage characteristics and electroluminescence spectra were analyzed to evaluate the device performance.
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