研究目的
Investigating the effect of Zn content on compositional, structural and vibrational properties of Cu2ZnSn1-xGexSe4 (CZTGSe, x ~ 0.5) thin films and their impact on solar cell efficiency.
研究成果
The study concludes that controlling the Zn content in CZTGSe thin films is crucial for optimizing solar cell performance. Excess Zn leads to the formation of ZnSe secondary phases, which negatively affect the solar cell efficiency. A compact structure with larger grain size and higher Ge content, without ZnSe, results in better solar cell performance.
研究不足
The study is limited to the effects of Zn content on CZTGSe thin films with a specific Ge content (x ~ 0.5). The non-uniform temperature distribution across the substrate and the formation of ZnSe secondary phases are identified as factors affecting the uniformity and performance of the solar cells.
1:Experimental Design and Method Selection:
CZTGSe thin films were deposited by co-evaporation onto Mo/SLG substrates followed by a thermal treatment. The study focused on the effect of Zn content on the films' properties.
2:Sample Selection and Data Sources:
Samples with varying Zn content were analyzed, with composition and morphology differences attributed to sample position and temperature distribution during co-evaporation.
3:List of Experimental Equipment and Materials:
Co-evaporation system, Mo/SLG substrates, thermal treatment setup, Raman spectroscopy, GIXRD, SEM, EDX, AES, and solar cell fabrication equipment.
4:Experimental Procedures and Operational Workflow:
Deposition of CZTGSe thin films, thermal treatment, characterization of compositional, structural, and vibrational properties, and fabrication and testing of solar cells.
5:Data Analysis Methods:
Analysis of Raman spectroscopy, GIXRD, SEM, EDX, and AES data to determine the effect of Zn content on film properties and solar cell performance.
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Mo/SLG substrate
Substrate for the deposition of CZTGSe thin films.
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Co-evaporation system
Used for the deposition of CZTGSe thin films.
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Raman spectroscopy
Used to determine the presence of ZnSe secondary phases and analyze the vibrational properties of the films.
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GIXRD
Used to investigate the structural properties of the CZTGSe thin films.
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SEM
Used to study the morphology of the CZTGSe/Mo/glass structure.
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EDX
Used to measure the chemical composition of the CZTGSe thin films.
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AES
Used to obtain in-depth chemical composition profiles of the CZTGSe thin films.
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Solar simulator
Sun 3000
Abet Technologies
Used to measure the I-V characteristics of the solar cells.
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EQE measurement system
PVE300
Bentham Instruments Ltd.
Used to perform external quantum efficiency measurements of the solar cells.
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Source meter
2400
Keithley Instruments Inc.
Used to collect reversed voltage-biased EQE curves.
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