研究目的
To achieve efficient and high-brightness perovskite light-emitting diodes (PeLEDs) with a novel blade-coated silver micro-flake (SMF) rear electrode, addressing the challenges of pinholes in solution-processed perovskite layers and the instability of organic electron-conducting layers.
研究成果
The work successfully demonstrates high-brightness PeLEDs with a novel SMF rear contact, achieving a maximum luminance of 98000 cd/m2 and an EQE of 4.6%. The SMF contact effectively prevents electrical shorting, enabling the use of inorganic ETLs like nc-ZnO. The study highlights the potential for scalable, low-cost fabrication of flexible and large-area PeLEDs.
研究不足
The study notes the operational instability of PeLEDs without encapsulation under continuous applied bias, attributed to Joule heating and ion migration through grain boundaries and defects in the perovskite layer. The stability under ambient conditions and the long-term operation of devices are identified as areas for further optimization.
1：Experimental Design and Method Selection:
The study employs a p-i-n architecture for PeLEDs, utilizing a novel blade-coated SMF rear electrode and a nanocrystalline ZnO inorganic electron transporting layer. The methodology includes optimizing the perovskite film morphology with polyethylene glycol (PEG) to reduce pinholes and enhance optical properties.
2：Sample Selection and Data Sources:
The samples include ITO-coated glass substrates with layers of PEDOT:PSS, MAPbBr3:PEG composite, nc-ZnO, and SMF contacts. Data sources include SEM, PL, TRPL, FTIR, and UPS measurements.
3：List of Experimental Equipment and Materials:
Equipment includes FESEM (TESCAN-LMU model), TEM (ZEISS EM900), UV-Visible spectrophotometer (AvaSpec 2048 model), Perkin-Elmer spectrofluorometric (Frontier model), Philips diffractometer (X'Pert MPD model), PerkinElmer FTIR spectrometer, and PHI5000 Versa Probe scanning photoelectron spectrometer. Materials include PbBr2, MABr, PEG, DMF, PEDOT:PSS, Zinc acetate dihydrate, KOH, and silver conductive paste LS-411 AW.
4：Experimental Procedures and Operational Workflow:
The fabrication process involves spin-coating PEDOT:PSS and perovskite:PEG composite layers, spin-coating nc-ZnO, and blade-coating SMF contacts. Characterization includes SEM imaging, PL and TRPL measurements, FTIR analysis, and UPS for work function determination.
5：Data Analysis Methods:
Data analysis includes image processing for pinhole area calculation, PL intensity and lifetime analysis, and EQE calculation from current and EL emission spectra.
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TEM
EM900
ZEISS
Size analysis of nanoparticles
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UV-Visible spectrophotometer
AvaSpec 2048
Avantes
Recording absorbance spectra
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spectrofluorometric
Frontier
Perkin-Elmer
Recording photoluminescence spectra
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FESEM
TESCAN-LMU
TESCAN
Characterization of film morphology
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diffractometer
X'Pert MPD
Philips
X-ray diffraction analysis
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FTIR spectrometer
PerkinElmer
Fourier-transform infrared analysis
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scanning photoelectron spectrometer
PHI5000 Versa Probe
Ultraviolet Photoelectron Spectroscopy
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silver conductive paste
LS-411 AW
ASAHI chemical research laboratories
Blade-coating for rear electrode
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