研究目的
Investigating the formation of silicon carbide nanocrystals and multilayer graphitic carbon by femtosecond laser irradiation of polydimethylsiloxane (PDMS) and their impact on the electrical conductivity of the fabricated structures.
研究成果
The study demonstrated the formation of SiC nanocrystals and graphitic carbon through femtosecond laser irradiation of PDMS, with the material's features varying by distance from the focal spot. The electrical conductivity of the structures increased with the number of scans, correlating with a decrease in disorder in the graphitic carbon. This method offers potential for tunable functionalization of PDMS for electronic device applications.
研究不足
The dimensions of the modified regions were significantly larger than the focal diameter due to thermal effects from the high repetition rate. The study suggests that adjusting the repetition rate could improve fabrication resolution.
1:Experimental Design and Method Selection
Femtosecond laser pulses were focused and scanned on the surface of PDMS to fabricate structures. Raman Spectroscopy and TEM were used for material analysis.
2:Sample Selection and Data Sources
PDMS sheets were prepared by mixing liquid photo-curable PDMS, de-gassing, and curing under UV light.
3:List of Experimental Equipment and Materials
Femtosecond laser (High Q-2, Spectra-Physics), 20x objective lens (Olympus), 3-axis translation stage, CMOS camera (Thorlabs), Raman spectrometer (InVia Raman Microscope, Renishaw), TEM (Tecnai G2, FEI), FIB for TEM sample preparation, digital source meter (175 True RMS Digital Multimeter, Fluke).
4:Experimental Procedures and Operational Workflow
Laser pulses were focused on PDMS surface, scanned to fabricate structures, and analyzed using Raman Spectroscopy and TEM. Electrical conductivity was measured using the two-probe method.
5:Data Analysis Methods
Raman spectra and TEM images were analyzed to identify the materials formed. Electrical resistance was measured to calculate conductance.
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Femtosecond laser
High Q-2
Spectra-Physics
Used for fabricating structures on PDMS surface.
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Objective lens
20x
Olympus
Focusing femtosecond laser pulses on PDMS surface.
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TEM
Tecnai G2
FEI
Nanoscale observations and analysis of the fabricated structures.
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Digital source meter
175 True RMS Digital Multimeter
Fluke
Measuring the electrical resistances of the fabricated structures.
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CMOS camera
Thorlabs
Monitoring the fabrication process in real time.
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Raman spectrometer
InVia Raman Microscope
Renishaw
Chemical analyses of the fabricated structures.
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