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Using Large Datasets of Organic Photovoltaic Performance Data to Elucidate Trends in Reliability Between 2009 and 2019

DOI:10.1109/JPHOTOV.2019.2939070 期刊:IEEE Journal of Photovoltaics 出版年份:2019 更新时间:2025-09-19 17:13:59
摘要: The application of data analytical approaches to understand long-term stability trends of organic photovoltaics (OPVs) is presented. Nearly 1900 OPV data points have been catalogued, and multivariate analysis has been applied in order to identify patterns, produce models that quantitatively compare different internal and external stress factors, and subsequently enable predictions of OPV stability to be achieved. Analysis of the weights associated with the acquired predictive model shows that for light stability (ISOS-L) testing, the most significant factor for increasing the time taken to reach 80% of the initial performance (T80) is the substrate and top electrode selection, and the best light stability is achieved with a small molecule active layer. The weights for damp-heat (ISOS-D) testing shows that the type of encapsulation is the primary factor affecting the degradation to T80. The use of data analytics and potentially machine learning can provide researchers in this area new insights into degradation patterns and emerging trends.
作者: Tudur Wyn David,Helder Anizelli,Priyanka Tyagi,Cameron Gray,William Teahan,Jeff Kettle
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To understand long-term stability trends of organic photovoltaics (OPVs) using data analytical approaches.

A multivariate approach has been applied to analyze and understand the patterns and structure of a dataset containing OPV performance and stability information. The MLR algorithm has been adopted in order to analyze the dataset, thereby allowing E0, T80, and TS80 to be predicted for ISOS-L data and ISOS-D data. The quality of the regression fit can be quantified by the R2 metric. The regression t-values are also extracted, which quantify how significant a particular parameter is for the model predictions, thus allowing the most significant factors affecting the performance and stability to be ascertained.

One of the limitations of the MLR approach is that data must be grouped into categories. Additional factors such as whether the active layer is planar or consists of a bulk-heterojunction, the composition of the active layer, and the deposition technique can be included. However, outliers of data can create significant noise in the model.

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