研究目的
The objective of the present work was to identify the presence of ??/?? phases and to study the properties such as dielectric constant, loss, modulus, AC conductivity of stretched, and poled PVDF thin ?lms subjected to ??-irradiation.
研究成果
?? phase was retained even after the irradiation thereby con?rming that the radiation damage was not signi?cant. The dielectric loss was minimum in the frequency range 102 to 104 Hz, giving the preferable frequency range of operation for devices.
研究不足
The study focuses on the effects of ??-irradiation on the dielectric properties of PVDF thin ?lms, but does not explore the effects of other types of radiation or the long-term stability of the irradiated ?lms under operational conditions.
1：Experimental Design and Method Selection:
PVDF thin ?lms were synthesized by solvent cast method and subjected to mechanical stretching and corona poling process. The ?lms were then exposed to ??-ray irradiation with doses of 25, 50, and 75 kGy.
2：Sample Selection and Data Sources:
PVDF granular AR grade was used, dissolved in N,N-dimethyl formamide solvent, and cast on a glass substrate.
3：List of Experimental Equipment and Materials:
PVDF (RM4439-100G) from Himedia Laboratories Pvt. Ltd., N,N-dimethyl formamide (DMF,
4：5%) from S. D. Fine-Chem. Ltd., Mitutoyo micrometer for thickness measurement, Gamma Cell for ??-irradiation, RIGAKU Ultima IV di?ractometer for XRD analysis, Novocontrol Alpha-N high resolution dielectric analyzer for dielectric parameters measurement. Experimental Procedures and Operational Workflow:
The ?lms were stretched and poled, then irradiated. XRD and dielectric spectroscopy were performed before and after irradiation.
5：Data Analysis Methods:
XRD patterns were analyzed to identify phases. Dielectric constant, loss, modulus, and AC conductivity were calculated and their variations with frequency and irradiation dose were studied.
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