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[IEEE 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) - HI, USA (2020.2.10-2020.2.13)] 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) - Feasibility of Plasmonic Circuits Merged with Silicon Integrated Circuits

DOI:10.23919/PanPacific48324.2020.9059350 出版年份:2020 更新时间:2025-09-19 17:13:59
摘要: If several feeders are interrupted in a severe accident, distribution networks should be restored by reconfiguring switches automatically with smart grid technologies. Although there have been several restoration algorithms developed to find the new network configuration, they might fail to restore the whole network if the network were critically damaged. The network’s design has to guarantee that it is restorable under any possible failure for secure power delivery, but it is a computationally hard task to examine all possible failures in a large-scale network with complex electrical constraints. This paper proposes a novel method to find all the critical (unrestorable) line cuts with great efficiency to verify the network design. The proposed method first runs a fast screening algorithm based on hitting set enumeration; the algorithm selects suspicious cuts without naively examining all possible cuts. Next, unrestorable cuts are identified from the suspicious ones with another algorithm, which strictly tests the restorability of the network under each suspicious cut without redundantly repeating heavy power flow calculations. Thorough experiments on two distribution networks reveal that the proposed method can find thousands of unrestorable cuts from the trillions of possible cuts in a large 432-Bus network with no significant false negatives.
作者: Takeru Inoue,Norihito Yasuda,Shunsuke Kawano,Yuji Takenobu,Shin-ichi Minato,Yasuhiro Hayashi
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To propose a novel method that efficiently finds all critical (unrestorable) line cuts in distribution networks to verify the network design for secure power delivery.

The proposed method efficiently finds all unrestorable cutsets with no significant false negatives. It reduces the number of tests by five orders of magnitude compared to the naive approach, with each test executed in just a few seconds. The method is applicable to large-scale networks and provides a crucial tool for guaranteeing the restorability of distribution networks.

The proposed method focuses only on line failures, since they are much more frequent than other failures like capacitor banks and switches. The method also puts an upper limit on the cutset size based on the maximum number of lines cut at a time, which might overlook some unrestorable cutsets.

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