研究目的
Investigating the high-performance flexible broadband photodetectors based on 2D hafnium selenosulfide nanosheets.
研究成果
The high-quality 2D layered HSS single crystals grown using the CVT technique exhibit exceptional photoresponse with giant photoresponsivity and high specific detectivity under both visible and near-infrared regions. The flexible photodetectors based on HSS single crystals show good photoresponsivity under flat and bending states, making them promising for future wearable electronics and integrated optoelectronic circuits.
研究不足
The study is limited by the complexity in attaining homogeneous distribution of chemical constituents in single crystals and the challenges in fabricating flexible devices with consistent performance under mechanical deformation.
1:Experimental Design and Method Selection:
The study involves the growth of high-quality HfSSe (HSS) single crystals using the chemical vapor transport (CVT) technique with iodine as the transporting agent. The crystals were characterized for their structural, optical, and electronic properties.
2:Sample Selection and Data Sources:
The samples were prepared from stoichiometric amounts of Hf, S, and Se powders. The growth was carried out in a horizontal two-zone muffle furnace.
3:List of Experimental Equipment and Materials:
Equipment includes a Bruker D2 PHASER for XRD, FEI Nova 200 for SEM, JEOL JEM-2100F for TEM, HORIBA Lab RAM HR for Raman spectroscopy, V-770 UV–visible/NIR spectrophotometer for absorption spectrum, AFM-Veeco-3100 for AFM, and Keithley 2636A source meter for electrical measurements.
4:Experimental Procedures and Operational Workflow:
The HSS single crystals were exfoliated into few-layer nanoflakes and transferred onto Si/SiO2 substrates for device fabrication. Au electrodes were deposited using a thermal evaporator.
5:Data Analysis Methods:
The photoresponsivity and specific detectivity were calculated from the photocurrent measurements under various laser illuminations.
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AFM-Veeco-3100
3100
Veeco
Atomic force microscopy
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Keithley 2636A
2636A
Keithley
Source meter for electrical measurements
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Bruker D2 PHASER
D2 PHASER
Bruker
X-ray diffraction analysis
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FEI Nova 200
Nova 200
FEI
Scanning electron microscopy
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JEOL JEM-2100F
JEM-2100F
JEOL
Transmission electron microscopy
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HORIBA Lab RAM HR
Lab RAM HR
HORIBA
Raman spectroscopy
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V-770 UV–visible/NIR spectrophotometer
V-770
Absorption spectrum measurement
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