摘要： This study aimed to investigate temperature dependencies at different injection currents (ICs) of the electroluminescence (EL) spectra from a green InGaN/GaN light-emitting diode (LED) based on multiple quantum wells (MQWs) grown on a Si substrate in a wide range of ICs (0.001–350 mA) and temperatures (6–350 K). The results show that the temperature-changing characteristic of the EL peak energy gradually evolves from an approximately V-shaped temperature dependence into a wave-shaped (three-step blueshift) dependence with increasing IC. Finally, it emerges as an approximately inverted V-shaped temperature dependence. The behavior reflects the fact that the emission related to InGaN is significantly influenced by the changing recombination dynamics of carriers with rising temperature or IC. This is attributed to the presence in the MQW active region of a stronger carrier localization effect across three zones with different average In contents. Moreover, with the decline of the temperature at lower ICs, the temperature behavior of the external quantum efficiency (EQE) value is dominated by the deactivated non-radiative centers. This phenomenon occurs not only in the higher temperature range but also at lower temperatures due to more In-content-induced structural defects, which are confirmed by measurements of the integrated EL intensity as well as the EQE dependence on IC.