研究目的
Investigating the preparation of CsPbI2Br films using chemical vapor deposition method and their application in photodetectors.
研究成果
CsPbI2Br films prepared at 600 °C exhibit nanofiber structure with low defect density and fast charge transport, leading to high-performance photodetectors. The study demonstrates the potential of chemical vapor deposition for fabricating perovskite-based optoelectronic devices.
研究不足
The study is limited to the temperature range of 400 °C–700 °C for film deposition and does not explore the effects of other deposition parameters such as gas flow rate or deposition time in detail.
1：Experimental Design and Method Selection:
Chemical vapor deposition method was used to prepare CsPbI2Br films at temperatures ranging from 400 °C to 700 °C. The method was chosen for its ability to control film morphology and optoelectronic properties.
2：Sample Selection and Data Sources:
Equimolar masses of CsBr and PbI2 powder were mixed, pressed into bulk, and sintered at 350 °C under nitrogen gas protection.
3：List of Experimental Equipment and Materials:
XRD, SEM, TEM, SAED for structural and morphology examination; emission spectrometer for PL spectra; TCSPC module for time-resolved fluorescence measurements; Keithley 4200-SCS for current and voltage properties testing.
4：Experimental Procedures and Operational Workflow:
The bulk material was placed in a high temperature zone and the substrate in a low temperature zone during deposition. The set temperature was maintained for 40 min with a carrier gas flow rate of 80 cubic centimeters per minute.
5：Data Analysis Methods:
Three exponential functions were used to fit the decay profiles from time-resolved PL measurements to analyze recombination lifetimes.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
time-correlated single photon counting module
SPC-150
Becker & Hickl
Conducting time-resolved fluorescence measurements
-
Semiconductor Characterization System
Keithley 4200-SCS
Keithley
Testing the current and voltage properties
-
x-ray diffraction
Examining the structural properties of perovskite films
-
scanning electron microscopy
Examining the morphology properties of perovskite films
-
transmission electron microscopy
Examining the microstructure of the perovskite fibers
-
selected-area electron diffraction
Confirming the single crystal structure in small area
-
emission spectrometer
PG2000 Pro
Idea Optics
Collecting the steady-state photoluminescence spectra
-
登录查看剩余5件设备及参数对照表
查看全部
