研究目的
To review cutting-edge ultrafast dynamic observation techniques for investigating the fundamental questions concerning the physical origin of the material removal process under femtosecond laser irradiation.
研究成果
The review highlights the importance of combining pump-probe methods, new ultrafast continuous imaging technology, and improved 4D S-UEM technology for a multiscale observation system with high spatial-temporal resolution and dynamic continuous observation capability.
研究不足
The techniques face challenges in temporal and spatial resolutions and panoramic measurement at different scales. Some methods are limited by the number of frames or the need for repetitive measurements.
1:Experimental Design and Method Selection:
The review surveys time-resolved pump-probe shadowgraphy, ultrafast continuous optical imaging, and four-dimensional ultrafast scanning electron microscopy.
2:Sample Selection and Data Sources:
Various materials under femtosecond laser irradiation are considered.
3:List of Experimental Equipment and Materials:
Includes femtosecond lasers, CCD cameras, optical delay lines, and electron microscopes.
4:Experimental Procedures and Operational Workflow:
Detailed descriptions of each technique's setup and application.
5:Data Analysis Methods:
Analysis of plasma dynamics, electron density, and material ejection processes.
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scanning electron microscope
FEI Quanta 650
FEI
Used for four-dimensional ultrafast electron microscopy.
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Ti:sapphire femtosecond laser
Used for generating femtosecond laser pulses for material processing and observation.
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CCD camera
Used for capturing transmitted shadowgraphs of plasma and shockwaves.
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optical delay line
Used to control the probe delays in pump-probe experiments.
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beta barium borate (BBO) crystal
Used for frequency doubling the probe beam.
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bandpass filter
400 nm
Used to suppress background illumination before the CCD.
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femtosecond Clark-MXR fiber laser
Clark-MXR
Integrated with the scanning electron microscope for generating femtosecond laser pulses.
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Everhart-Thornley detector
Used to collect the secondary electrons emitted from the specimen in S-UEM.
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