研究目的
To develop stable α-FAPbI3 perovskite 1D structure arrays with high crystallinity and ordered crystallographic orientation for ultrasensitive photodetectors.
研究成果
The study successfully fabricated FAPbI3 perovskite 1D structure arrays with high crystallinity, large grain size, (001) crystallographic orientation, and suppressed trap density, demonstrating excellent optoelectronic performance and environmental stability. Photodetectors made from these structures showed high responsivity and detectivity, attributed to the ordered crystallographic orientation and suppressed grain boundaries.
研究不足
The study focuses on the fabrication and characterization of α-FAPbI3 1D structures and their application in photodetectors, but does not explore other potential applications or the scalability of the fabrication process.
1:Experimental Design and Method Selection:
The study employed a capillary-bridge-mediated assembly technique and incorporated PEA+ cations to fabricate FAPbI3 wire arrays with stable α-phase.
2:Sample Selection and Data Sources:
FAPbI3 precursor was prepared by dissolving stoichiometric FAI and PbI2 in a solution of DMSO/DMF.
3:List of Experimental Equipment and Materials:
SEM (Hitachi 8010), AFM (Bruker Nano Inc. ICON2-SYS), TEM (JEM-2100F), XRD (Bruker D8 focus diffractometer), PL and TRPL spectra (Edinburgh Instruments FLS 1000), MS spectra (FT-ICR-MS, Bruker, Solarix
4:4T), XPS (ThermoFisher ESCALAB 250Xi), absorption spectra (Varian Cary 5000), GIWAXS patterns (Beijing Synchrotron Radiation Facility). Experimental Procedures and Operational Workflow:
The FAPbI3 precursor was dripped onto a silicon template with asymmetric wettability and covered with a target substrate, then stored in a vacuum oven.
5:Data Analysis Methods:
The quality of perovskite 1D structures was analyzed through SEM, AFM, TEM, XRD, PL, TRPL, MS, XPS, and absorption spectroscopy.
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MS spectra
Solarix 9.4T
Bruker
Performance of MS spectra
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XPS
ESCALAB 250Xi
ThermoFisher
Collection of XPS
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SEM
Hitachi 8010
Hitachi
Characterization of the morphology of perovskite 1D structure arrays
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TEM
JEM-2100F
JEOL
Collection of SAED pattern and TEM image
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XRD
D8 focus diffractometer
Bruker
Measurement of XRD patterns
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PL and TRPL spectra
FLS 1000
Edinburgh Instruments
Performance of PL and TRPL spectra
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AFM
ICON2-SYS
Bruker Nano Inc.
Evaluation of the roughness
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Absorption spectra
Cary 5000
Varian
Acquisition of absorption spectra
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GIWAXS patterns
Beijing Synchrotron Radiation Facility
Collection of GIWAXS patterns
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