研究目的
Investigating the stability and performance of magnesium zinc oxide (MZO) as a front contact material for CdTe-based solar cells, particularly focusing on its resilience to oxygen presence during device processing and its potential for efficiency improvement.
研究成果
Reactive co-sputtering produces robust, high-quality MZO films suitable for CdTe solar cells, demonstrating stability over time and resilience to oxygen presence during processing. The combinatorial approach accelerates optimization, with potential for further efficiency improvements through back contact optimization.
研究不足
The study focuses on the stability and performance of MZO films under specific conditions, and while efficiencies of around 16% have been achieved, further optimization of thin film deposition and device processing parameters, especially the back contact, is needed to increase efficiency.
1:Experimental Design and Method Selection
MZO films were deposited by reactive co-sputtering from elemental Zn and Mg targets in an AJA Orion-5 chamber. The substrate was held stationary during deposition of combinatorial libraries; the substrate was rotated to produce single composition films.
2:Sample Selection and Data Sources
TEC10 glass superstrates were used for devices and were cleaned prior to being loaded into the sputter chamber. Si wafers and glass slides were used for MZO thickness and band gap measurements, respectively.
3:List of Experimental Equipment and Materials
AJA Orion-5 chamber, Zn (99.99%) and Mg (99.95%) targets, TEC10 glass superstrates, Si wafers, glass slides, Micro 90 solution, UV-ozone treatment, isopropanol, Argon and oxygen gases.
4:Experimental Procedures and Operational Workflow
Plasma clean at 50 W for 5 min in 5 mTorr of Ar was performed on all substrates right before MZO deposition. Argon and oxygen were supplied in a 2:1 ratio at P = 5 mTorr. MZO deposition was done without intentional substrate heating.
5:Data Analysis Methods
Kelvin probe was utilized to measure the work function of MZO. Optical transmission measurements for MZO thin films were performed using Cary UV–Vis spectrophotometer. Tauc plots were then constructed based on UV–Vis transmission data to determine the direct band gap of MZO thin films.
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