研究目的
To address the doping difficulty issue hindering VOC improvement in current Sb2Se3-based thin film solar cells by implementing a strategy to controllably vary the carrier density of Sb2Se3-based absorbers through the incorporation of Ag into the Sb2Se3 absorbers, leading to the formation of a (Sb2Se3)x(AgSbSe2)1-x alloy.
研究成果
The alloying of Sb2Se3 with AgSbSe2 significantly improves the VOC of solar cells, demonstrating a universal approach to control the photoelectrical properties for high-efficiency Sb2Se3-based solar cells. The strategy could lead to low-cost, highly-efficient solar cells with improved stability and performance.
研究不足
The study notes the challenge of suppressing the formation of deep-level recombination center defects in Sb2Se3 crystals due to their low symmetry and the difficulty in achieving homogeneous Ag distribution within the films.
1:Experimental Design and Method Selection:
The study employs a close spaced sublimation (CSS) technique to deposit the absorber layers, with the incorporation of Ag to form (Sb2Se3)x(AgSbSe2)1-x alloy films.
2:Sample Selection and Data Sources:
Samples were deposited on glass substrates with Mo back contacts, followed by a post-selenization process to form a thin MoSe2 layer.
3:List of Experimental Equipment and Materials:
Equipment includes a magnetron sputtering system for Mo deposition, CSS system for absorber layer deposition, and various characterization tools like XRD, SEM, AFM, TOF-SIMS, XPS, UPS, and spectrophotometer.
4:Experimental Procedures and Operational Workflow:
The process involves Mo deposition, Ag sputtering, CSS deposition of absorber layers at varying temperatures, CdS coating by chemical bath deposition, and window layer sputtering.
5:Data Analysis Methods:
Characterization of crystal structure, morphology, composition, and optical properties, alongside device performance measurements under standard conditions.
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X-ray photoelectron spectrometer
ESCALAB 250Xi
Thermo Scientific
Measurement of chemical state of elements in films
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Ultraviolet photoemission spectrometer
ESCALAB 250Xi
Thermo Scientific
Measurement of band structure of films
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Spectrophotometer
Perkin-Elmer Lambda 950
Perkin-Elmer
Measurement of optical properties of films
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X-ray diffractometer
Bruker D8 Advance
Bruker
Characterization of crystal structure and composition of films
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Field emission scanning electron microscopy
FEI nova nano SEM450
FEI
Observation of film morphology
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Atomic force microscopy
Veeco Multimode 8
Veeco
Observation of film morphology
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Time-of-flight secondary ion mass spectrometry
TOF-SIMS 5-100
ION-TOF GmbH
Characterization of depth distribution of Ag
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Solar simulator
XES-100S1
SAN-EI
Measurement of device performance under AM1.5 conditions
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