研究目的
Investigating the effects of a π-conjugated ligand, 4-aminobenzonitrile (ABN), on the performance of methylammonium lead bromide (MAPbBr3)-based perovskite light-emitting diodes (PeLEDs) by reducing crystal size and trap density, and optimizing the charge-transport layer.
研究成果
The application of ABN as a π-conjugated ligand significantly improved the performance of MAPbBr3-based PeLEDs by reducing crystal size and trap density. The optimized PeLED exhibited a maximum luminance of 3350 cd/m2 and an EQE of 8.85%. The study highlights the importance of ligand engineering and HTL modification for high-performance PeLEDs.
研究不足
The study is limited by the operational stability of PeLEDs under ambient conditions without encapsulation and the potential for non-uniformity in the perovskite film with excessive ABN concentration.
1：Experimental Design and Method Selection:
The study involved the fabrication of PeLEDs with MAPbBr3–ABN films using a spin-coating method. The interaction between MAPbBr3 crystals and ABN molecules was investigated through FTIR spectroscopy and XPS analysis.
2：Sample Selection and Data Sources:
Precursor solutions were prepared with different concentrations of ABN (0,
3：5, 0, and 0 wt%) in MAPbBrList of Experimental Equipment and Materials:
SEM, AFM, XRD, μ-PL system, contact-angle analyzer, FTIR spectrometer, XPS, UPS, and UV–visible spectrophotometer were used. Materials included PEDOT:PSS, PVK, PVP, PMMA, and Ag NWs.
4：Experimental Procedures and Operational Workflow:
The fabrication process involved spin-coating layers of PEDOT:PSS, PVK, PVP, MAPbBr3–ABN, PMMA, and Ag NWs on ITO/glass substrates, followed by annealing.
5：Data Analysis Methods:
The morphology, crystal size, and trap density of the films were analyzed using SEM, AFM, and XRD. The luminescent properties were evaluated through PL and EL measurements.
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UV–visible spectrophotometer
V-670
JASCO
Measuring the UV–visible spectra.
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SEM
S-5000
Hitachi
Examining the morphology and roughness of the perovskite films and HTLs.
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XRD
SmartLab
Rigaku
Measuring the X-ray diffraction patterns of the perovskite films.
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FTIR spectrometer
Vertex 70
Bruker
Performing Fourier transform infrared spectroscopy.
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AFM
MFP-3D
Asylum
Measuring the roughness of the MAPbBr3–ABN films.
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μ-PL system
Dongwoo Optron
Dongwoo Optron
Measuring the PL spectra.
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Contact-angle analyzer
Phoenix 300
SEO
Measuring the water contact angles.
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XPS
K-alpha
Thermo U. K.
Performing X‐Ray photoelectron spectroscopy analysis.
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UPS
AC-2
Riken Co., Ltd.
Determining the band positions of the perovskite films.
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