研究目的
Verification of the holography method by a comparison of the results obtained with the data obtained by other methods for detection of volumetric defects in ZnGeP2 single crystals.
研究成果
The digital holography method has been successfully applied to investigate volumetric defects in ZnGeP2 single crystals, allowing detection and identification of defects with minimal linear size of ~15–20 μm. The method is promising for technological control and quality assurance certification of optical crystals.
研究不足
The minimum recorded defect sizes are ~15–20 μm, limited by the matrix pixel size and wavelength of hologram recording. The maximum sample thickness of 50 mm was limited by the absorption coefficient of the material, the sensitivity of the CCD camera, and the output power of the laser diode.
1：Experimental Design and Method Selection:
The method of IR digital holography was used to detect volumetric defects in ZnGeP2 single crystals. The setup included a semiconductor laser diode with a wavelength of
2：064 μm and a CCD camera with a 1600 × 1200-pixel matrix. Sample Selection and Data Sources:
ZnGeP2 single crystal samples with thickness up to 50 mm were used.
3：List of Experimental Equipment and Materials:
Semiconductor laser diode (
4：064 μm, 100 mW), CCD camera (1600 × 1200-pixel matrix, pixel sizes no more than 4 μm × 4 μm), collimator with a focal length of 70 mm. Experimental Procedures and Operational Workflow:
Light from the laser passed through a collimator and the sample, forming an interference pattern recorded by the CCD camera. The digital hologram was then numerically processed to restore images of the sample cross sections.
5：Data Analysis Methods:
Numerical calculation of diffraction integral was used to restore images of the sample cross sections, allowing visualization and measurement of defects.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容
