研究目的
To improve the performance of ZnO-based self-powered photodetectors by reducing surface and interface states through ultraviolet irradiation and enhancing the pyro-phototronic effect.
研究成果
UV irradiation effectively reduces surface and interface states in ZnO, enhancing the performance of p-Si/n-ZnO self-powered photodetectors through the pyro-phototronic effect. The method significantly improves the photodetectors' responsivity and response speed, making them suitable for applications in Internet of things, broad spectral detecting, and smart optoelectronic devices.
研究不足
The study focuses on the modification of ZnO surface states through UV irradiation and its impact on the pyro-phototronic effect. However, the long-term stability of the modified surface states and the scalability of the UV irradiation process for large-scale production are not addressed.
1:Experimental Design and Method Selection:
The study involves the fabrication of a p-Si/n-ZnO heterostructure self-powered photodetector and its modification through UV irradiation to reduce surface and interface states. The pyro-phototronic effect is utilized to enhance the device's performance.
2:Sample Selection and Data Sources:
A p-type Si wafer is used as the substrate, with ZnO nanowires grown hydrothermally to form the heterojunction.
3:List of Experimental Equipment and Materials:
Equipment includes RF magnetron sputtering for ZnO seed layer deposition, a mechanical convection oven for hydrothermal growth, and various lasers for UV irradiation and testing. Materials include Zn(NO3)2 and hexamethylenetetramine for ZnO nanowire growth.
4:Experimental Procedures and Operational Workflow:
The process involves cleaning the Si wafer, depositing a ZnO seed layer, growing ZnO nanowires, and sputtering ITO and Ag films as electrodes. The device is then subjected to UV irradiation to modify its surface states.
5:Data Analysis Methods:
The performance of the photodetector is analyzed through I-V and C-V measurements, photoluminescence spectra, and absorption spectra to assess the impact of UV irradiation on the device's optoelectronic properties.
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He-Cd dual-color laser
IK5751I-G
Kimmon Koha Co., Ltd.
Provision of optical irradiation and input stimuli
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Power and energy meter
PM 320E
Thorlabs
Recording of light intensity
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RF magnetron sputtering
PVD75
Kurt. J. Lesker Company
Deposition of ZnO seed layer
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Scanning electron microscope
Hitachi SU8010
Hitachi
Characterization of ZnO nanowires
暂无现货
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UV–vis spectrophotometer
JΛSCO V-630
JΛSCO
Measurement of absorption spectra
暂无现货
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Semiconductor analyzer
Keithley 4200A-SCS
Keithley
Measurement of I–V and C-V curves
暂无现货
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Low noise current preamplifier
SR570
Stanford SRS
Measurement of I–t characteristics
暂无现货
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Low noise voltage preamplifier
SR560
Stanford SRS
Measurement of V-t characteristics
暂无现货
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Fluorescence spectrometer
Fluorolog-Tau-3
Measurement of photoluminescence spectra
暂无现货
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GPIB controller
GPIB-USB-HS
NI 488.2
Control of measurement system
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Solid-state laser
25-LHP-928-230
Provision of 633 nm laser
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Solid-state laser
I0785SD0100B
Provision of 785 nm laser
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