研究目的
To investigate the influence of active layer thicknesses on the optical and electronic structure of P-I-N heterojunction CH3NH3PbI3-xClx PSCs.
研究成果
The study concludes that the optimal thickness for CH3NH3PbI3-xClx perovskite films in PSCs is 310 nm, which yields the highest PCE of 12.69%. This thickness results in a strong interfacial dipole of 0.23 eV, optimal band alignment, and minimal energy barriers for charge carrier extraction. The findings provide insights into the design and optimization of PSCs.
研究不足
The study is limited to CH3NH3PbI3-xClx perovskite films and does not explore other perovskite compositions. The influence of film thickness on device performance is investigated, but other factors such as temperature and humidity effects are not considered.
1：Experimental Design and Method Selection:
The study involved fabricating inverted, planar heterojunction PSCs with variable thicknesses of CH3NH3PbI3-xClx perovskite films. The films were characterized using SEM, XRD, UV-vis absorption spectra, and UPS to understand their morphological, crystal, optical properties, and electronic band structure.
2：Sample Selection and Data Sources:
Perovskite films with thicknesses of 180, 210, 310, 400, and 440 nm were prepared by spin-coating solutions of PbCl2 and CH3NH3I in DMF on FTO/PEDOT:PSS substrates.
3：List of Experimental Equipment and Materials:
Equipment included a Keithley 2635 source measure unit for J-V measurements, a Bruker AXS D8 Advance diffractometer for XRD, a JEOL JSM-6700F FE-SEM for SEM imaging, and an ESCALAB 250-X apparatus for XPS and UPS spectra.
4：Experimental Procedures and Operational Workflow:
The perovskite films were spin-coated at 2000 rpm for 40 sec and annealed at 90°C for 120 minutes. PC61BM was spin-coated as the ETL, and an 80 nm Aluminum counter electrode was deposited under high vacuum.
5：Data Analysis Methods:
The optical properties were simulated using the transfer matrix method, and the electronic structure was analyzed using UPS spectra.
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