研究目的
To design a promising Cu2ZnSn(SSe)4 nanocrystalline thin film via a facile, cost-effective and non-toxic single-step hydrothermal route for efficient photovoltaic performance.
研究成果
The hydrothermally synthesized CZTSSe nanocrystalline thin films exhibit promising photovoltaic performance with a photoconversion efficiency of 3.41%, making them suitable for film solar cell technology.
研究不足
The study focuses on the synthesis and characterization of CZTSSe films via a hydrothermal route but does not extensively explore the scalability of the process or the long-term stability of the films under operational conditions.
1:Experimental Design and Method Selection:
The study employed a modified one-step hydrothermal route to synthesize CZTSSe nanocrystalline thin film using Na2-EDTA as a complexing agent.
2:Sample Selection and Data Sources:
Precursor chemicals of analytical grade were used without further purification.
3:List of Experimental Equipment and Materials:
Chemicals included copper(II) acetate monohydrate, zinc(II) acetate dihydrate, tin chloride, disodium salt of ethylenediaminetetraacetic acid, thiourea, and sodium selenosulfite. Equipment included a Teflon liner autoclave, UV–Vis spectrophotometer, X-ray diffractometer, Raman spectrometer, SEM with EDS, XPS, and electrochemical workstation.
4:Experimental Procedures and Operational Workflow:
The deposition involved adjusting the pH of the solution, transferring it to a Teflon liner autoclave, and heating at 160 °C for 4 h.
5:Data Analysis Methods:
Structural, optical, morphological, and compositional analyses were performed using various characterization techniques.
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Scanning electron microscope
JSM-6360A
JEOL
To capture morphology and elemental analysis
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X-ray Photoelectron Spectroscopy
Multilab-2000
Thermo Scientific
To analyze the oxidation states of constituent elements
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Electrochemical workstation
PGSTAT 100
AUTOLAB
To perform photovoltaic performance and EIS analysis
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UV–Vis spectrophotometer
To analyze the optical absorption spectra of films
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X-ray diffractometer
D8
Bruker AXS
To estimate structural parameters of the films
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Raman spectrometer
In Via 90V727
Renishaw
To analyze the phase formation and crystal structure
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