研究目的
To homogenize the LC effect in a current-limiting cell by Al2O3 passivation of a full III-V on Ge MJSC device.
研究成果
Thin Al2O3 passivation layer was successfully deposited on commercial III-V on Ge 3JSCs by ALD technique non-invasively. Results revealed that the Al2O3 sidewall passivation can enhance the LC current production homogeneity in a limiting cell of InGaP/GaAs/Ge 3JSC by about 7.2%. Furthermore, the current production by LC effect and by direct excitation of the limiting GaAs middle cell increased by about 21.9% and 16.3% relative to the sample without Al2O3 layer on the sidewalls, respectively. These suggest perimeter recombination reduction, making it an important consideration for homogenizing current production in III-V on Ge MJSCs.
研究不足
The study focuses on the impact of sidewall passivation on LC effect uniformity and current collection in MJSCs, but does not address potential optical losses or electrical losses in other parts of the cell. The effectiveness of Al2O3 passivation may vary with different MJSC designs or materials.
1：Experimental Design and Method Selection:
The study employed atomic layer deposition (ALD) of Al2O3 on the sidewalls of commercial III-V on Ge MJSC samples to passivate perimeter defects. Laser beam induced current (LBIC) mapping was used to evaluate the samples.
2：Sample Selection and Data Sources:
Commercial InGaP/GaAs/Ge 3JSC samples were used, with some samples subjected to Al2O3 sidewall passivation and others left unprocessed as references.
3：List of Experimental Equipment and Materials:
ALD tool for Al2O3 deposition, LBIC setup with 785-nm and 450-nm lasers, and Si masks for sample preparation.
4：Experimental Procedures and Operational Workflow:
Al2O3 was deposited on the MJSC sidewalls by ALD. LBIC mapping was then performed to assess current collection in the GaAs middle cell under direct excitation and LC effect conditions.
5：Data Analysis Methods:
The normalized standard deviation of current collection and percent differences of specific parameters between the reference and passivated samples were derived from the LBIC measurements.
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