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One-step growth of centimeter-scale doped multilayer MoS <sub/>2</sub> films by pulsed laser-induced synthesis

DOI:10.1039/C9TC06908A 期刊:Journal of Materials Chemistry C 出版年份:2020 更新时间:2025-09-23 15:21:01
摘要: Recently, two-dimensional MoS2 has attracted interest for applications in electronics, optics, energy storage, and catalysis. Furthermore, n-type or p-type doping of MoS2 can result in improved film properties, thereby expanding the range of applicability. However, the rapid preparation of large-scale MoS2 films and the e?ective doping of such films remain challenging. Herein, we report on a one-step growth method called pulsed laser-induced synthesis (PLIS) that can resolve these challenges and can quickly (5–10 min) prepare centimeter-scale MoS2 films directly and selectively on a substrate. A continuous length of up to 1.412 cm can be achieved with MoS2 films prepared by the described in situ doping of noble metals (Au, Pt, and Pd) to convert MoS2 into a p-type semiconductor was realized, consistent with the results obtained from first-principles calculations. The STEM images reveal that the phenomena of surface modification and cation substitution occur in the doped MoS2 films. The doped MoS2 films were further processed into a p-type field effect transistor with an on/off ratio of 105. Importantly, this technique can be applied to other transition metal dichalcogenides (TMDCs) while employing various doping elements; this scheme provides an innovative method for upscaling production and large-area doping of TMDC thin films.
作者: Yishuo Hu,Wenzhao Wang,Zhenyu Guo,Wen Jin,Shibo Wang,Jichang Lu,Yirong Zeng,Tingting Ren,Yonghong Xiao,Yang Zeng,Xiangbin Zeng
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To develop a one-step growth method for the rapid preparation of large-scale doped MoS2 films and to investigate their properties and applications.

The PLIS method successfully enables the one-step growth of centimeter-scale doped MoS2 films with p-type characteristics, demonstrating potential for large-scale production and application in electronics. The technique's compatibility with traditional CMOS processes suggests promising prospects for the industrialization of TMDCs.

The technique's scalability is dependent on the laser device's capability to provide a larger scanning area. The study focuses on noble metal doping, and the applicability to other doping elements needs further exploration.

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