研究目的
Investigating the effects of irradiation damage on CMOS sensors in space optical communication systems, specifically focusing on the deviation of image centroid and its impact on tracking and pointing accuracy.
研究成果
Radiation damage significantly affects the tracking and pointing accuracy of optical communication systems by causing centroid deviation in CMOS sensors. The deviation is influenced by the number and position of defect pixels, with potential impacts on system performance in space environments. Radiation resistance should be considered in the design and optimization of optical communication systems.
研究不足
The study focuses on specific irradiation conditions and a particular type of CMOS sensor (CMV4000). The findings may not be directly applicable to other sensor types or different irradiation conditions without further research.
1：Experimental Design and Method Selection:
The study involved irradiation experiments on CMV4000 CMOS sensors to evaluate their resistance to total dose effect and displacement damage effect. The gray centroid algorithm was used to calculate image centroid deviation values with radiation-induced defects.
2：Sample Selection and Data Sources:
Samples included CMV4000 CMOS sensors subjected to proton and gamma irradiation. Data was collected from images before and after irradiation.
3：List of Experimental Equipment and Materials:
CMV4000 CMOS sensors, cobalt chamber for TID test, proton accelerator for displacement damage test.
4：Experimental Procedures and Operational Workflow:
Samples were irradiated to specific dose points (2×1011p/cm2 for displacement damage and 100krad (Si) for total dose effect). Images were captured before and after irradiation for analysis.
5：Data Analysis Methods:
The gray centroid algorithm was applied to calculate the centroid deviation values from the images, analyzing the impact of defect pixels on centroid accuracy.
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