研究目的
Investigating the use of intensity modulated photoluminescence for rapid series resistance mapping of perovskite solar cells to identify defects and imperfections that limit their performance.
研究成果
The study demonstrates a new camera-based luminescence method for mapping the series resistance of perovskite solar cells, which is robust and can be readily applied for routine analysis. The method allows for the rapid identification of spatially inhomogeneous defects affecting device performance and can be scaled for large area analysis.
研究不足
The technique requires steady-state conditions for meaningful measurements, which can be time-consuming to achieve. Additionally, the method may fail at voltages below 0.7 V due to low signal-to-noise ratios and at voltages approaching the open circuit voltage due to reduced variation in photoluminescence intensity.
1：Experimental Design and Method Selection:
The study employs intensity modulated photoluminescence (IMPL) to spatially map the series resistance of perovskite solar cells. The technique involves modulating the light intensity to induce a modulation in the luminescence intensity, allowing for rapid reading of device properties under various illumination conditions.
2：Sample Selection and Data Sources:
The study uses a batch of perovskite solar cells with normal and inverted structures. The cells were fabricated using a consistent method to ensure uniformity in the initial conditions.
3：List of Experimental Equipment and Materials:
Equipment includes a Keithley 2400 for dynamic IV scans, a Keithley 2220 for light modulation, and a D610 camera with a VR Micro-NIKKOR 105 mm f/2.8G lens for luminescence imaging. Materials include perovskite precursor solutions and various layers for the solar cell structures.
4：8G lens for luminescence imaging. Materials include perovskite precursor solutions and various layers for the solar cell structures.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The procedure involves performing dynamic JV scans with light modulation at each voltage step to measure the photoluminescence response. The current is monitored until stabilization before modulation to ensure steady-state conditions.
5：Data Analysis Methods:
The analysis involves fitting the light intensity and photoluminescence data with sinusoidal functions to determine the series resistance. The mean local series resistance is compared with global resistance values obtained from J-V data for validation.
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