摘要： Ultrafast electron di?raction (UED) with high temporal and spatial resolutions is a powerful tool to observe transient structural changes in materials on an atomic scale. This technique is based on a pump-probe method using ultrashort laser and electron pulses. Therefore, UED requires that the measured transients be highly repeatable. Moreover, the relative time jitter between laser and electron pulses signi?cantly a?ects the UED temporal resolution. To overcome the UED technical limitations, we propose a technique called compressed ultrafast electron di?raction imaging (CUEDI). In this technique, we encode time-evolving electron di?raction patterns with random codes on an electron encoder. Then, the encoded electron di?raction pattern is measured by a detector after a temporal shearing operation. Finally, the evolution process of the electron di?raction pattern is reconstructed using a compressed sensing algorithm. We con?rm the feasibility of our proposed scheme by numerically simulating the polycrystalline gold melting process based on the experimental data measured with the pump-probe method. Because CUEDI employs a continuous or long electron pulse, the relative time jitter between laser and electron pulses can be eliminated. Additionally, CUEDI measures transients with a single shot, which allows irreversible processes to be directly observed.