研究目的
Investigating the effect of machining and electric field poling on the domain configuration of PMN–PT single crystals and exploring methods to control domain configuration for improved optical properties.
研究成果
The domain configuration of PMN–PT single crystals is sensitive to machining processes, leading to disordered domain patterns that can degrade optical properties. However, these disordered patterns can be eliminated through temperature cycling, resulting in crack-free single-domain crystals with improved optical performance.
研究不足
The study is limited to [001]-oriented tetragonal PMN–PT single crystals. The effects of machining on domain configuration may vary with crystal orientation and composition.
1:Experimental Design and Method Selection:
The study involved observing the domain configuration changes in PMN–PT single crystals under different machining processes and electric field poling. A temperature cycling method was proposed to eliminate disordered domain patterns.
2:Sample Selection and Data Sources:
[001]-oriented tetragonal PMN–PT single crystals were used, grown using the modified Bridgman technique.
3:List of Experimental Equipment and Materials:
Polarizing light microscope (PLM, Olympus BX51), piezoelectric force microscope (PFM, Dimension Icon, Bruker, Germany), Agilent E4980A LCR analyzer, piezoelectric-d33 meter (ZJ-2), Jasco V-570 UV–VIS–IR spectrophotometer.
4:Experimental Procedures and Operational Workflow:
Crystals were cut, ground, and polished, then subjected to electric field poling and temperature cycling. Domain patterns were observed before and after treatments.
5:Data Analysis Methods:
Dielectric properties and transmission spectra were compared between samples with different domain configurations.
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polarizing light microscope
BX51
Olympus
Optical observation of the domain pattern
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piezoelectric force microscope
Dimension Icon
Bruker
Observation of the restricted area poled domain pattern
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LCR analyzer
E4980A
Agilent
Measurement of temperature-dependent dielectric permittivity
E4980A/E4980AL Precision LCR Meter
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UV–VIS–IR spectrophotometer
V-570
Jasco
Recording transmission spectra at room temperature
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piezoelectric-d33 meter
ZJ-2
Measurement of piezoelectric coefficient d33
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