研究目的
Investigating the characterization and on-line adjustment of the sagittal-bent Laue crystal profile to focus high-energy X-ray beams.
研究成果
The study successfully characterized the bent Laue crystal monochromator using various measurement techniques, providing quick feedback on the on-line adjustment of the bending condition. The results were consistent with analytical models derived from elastic theory.
研究不足
The study acknowledges the challenge of achieving higher-accuracy results as a subject of ongoing research, indicating current technical constraints.
1:Experimental Design and Method Selection:
The study employed off-line optical metrology and on-line X-ray experiments including double-crystal topography and ray-tracing measurement to characterize the bent-crystal shape.
2:Sample Selection and Data Sources:
A polished silicon (100) wafer with specific dimensions and a tungsten mask were used in the experiments.
3:List of Experimental Equipment and Materials:
A Zygo Verifire QPZ interferometer, a self-collimator (M?ller-WEDEL OPTICAL GmbH, Elcomat 3000), and a CCD were among the equipment used.
4:Experimental Procedures and Operational Workflow:
The bent-crystal surface was measured using optical metrology, and on-line characterization was performed using X-ray experiments.
5:Data Analysis Methods:
The data were analyzed to fit the bent-crystal surface to a saddle surface and to calculate the meridional and sagittal radii of curvature.
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