研究目的
To demonstrate the capability of atomic force microscopy (AFM) in determining the structure of unknown phases of silicene on the Ag(111) surface, specifically identifying two types of buckled structures of (√13×√13)R13.9? silicene that had not been previously discriminated.
研究成果
High-resolution AFM has been demonstrated as a powerful tool for identifying the structural phases of silicene on Ag(111), revealing two previously undiscriminated buckled structures. The combination of AFM observations and DFT calculations provides a comprehensive understanding of silicene's structural diversity and the mechanism behind high-resolution AFM imaging.
研究不足
The study is limited by the resolution of AFM and the complexity of silicene's structural diversity on Ag(111). The theoretical models may not fully capture all aspects of the experimental observations due to simplifications in the simulations.
1：Experimental Design and Method Selection:
High-resolution AFM observation was conducted on silicene grown on Ag(111) surfaces to identify its structural phases. Theoretical simulations using density functional theory (DFT) were performed to model the observed structures.
2：Sample Selection and Data Sources:
Silicene samples were prepared by depositing Si onto clean Ag(111) surfaces held at 250°C. AFM topographic images were obtained under ultrahigh vacuum conditions at room temperature.
3：List of Experimental Equipment and Materials:
Commercial Si cantilevers with resonance frequencies of 130–160 kHz and spring constants of 20–30 N/m were used. Optical interferometers detected cantilever deflections.
4：Experimental Procedures and Operational Workflow:
AFM images were obtained by maintaining the frequency shift of oscillated cantilevers. The contact potential difference was compensated by applying a corresponding voltage to the sample.
5：Data Analysis Methods:
The structure models obtained by DFT calculations were compared with AFM and STM images to identify the buckled structures of silicene.
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