研究目的
Investigating the tunable luminescence contrast in photochromic ceramics (1-x)Na0.5Bi0.5TiO3-xNa0.5K0.5NbO3:0.002Er by an electric field poling.
研究成果
The study developed new photochromic ferroelectric ceramics and demonstrated that electric poling can greatly enhance the photochromic reaction and luminescence contrast in compositions with strong nonergodicity (x=0.02, 0.04, 0.06), while having the opposite effect in compositions with higher ergodicity (x=0.08, 0.10, 0.12). This finding opens a window for enhancing photochromic reactions in similar materials.
研究不足
The study focuses on the effect of electric poling on photochromic reaction and luminescence contrast in specific compositions of Er3+ doped (1-x)Na0.5Bi0.5TiO3-xK0.5Na0.5NbO3 ceramics. The mechanisms proposed are based on the observed data and may require further validation.
1：Experimental Design and Method Selection:
Developed a binary solid solution of Er3+ doped (1-x)Na
2：5Bi5TiO3-xK5Na5NbO3 ferroelectric ceramics. Realized reversible photochromic reaction and luminescence modulation via alternating 405-nm light irradiation and thermal stimulation. Sample Selection and Data Sources:
Prepared ceramics with x=
3：02, 04, 06, 08, 10, List of Experimental Equipment and Materials:
Used X-ray diffractometer (XRD, D8 Advance, Bruker), scanning electron microscopy (SEM, Hitachi SUS-700), spectrofluorometer (FS5, Edinburgh Instrument, UK), ferroelectric analyzer (Premier II, Radiant Technologies, U. S.), Agilent 4294A impedance analyzer, PTS-2000H measuring system, atomic force microscope (Cypher-HV, Asylum Research, U.S.).
4：Experimental Procedures and Operational Workflow:
Prepared ceramics by traditional solid-state reaction sintering method, measured crystal structure, surface microstructure, upconversion luminescence spectra, ferroelectric loops, dielectric performances, and piezoresponse force microscopy.
5：Data Analysis Methods:
Analyzed XRD patterns, SEM images, luminescence spectra, ferroelectric and dielectric properties, and PFM images.
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X-ray diffractometer
D8 Advance
Bruker
Measuring the crystal structure of ceramic wafers
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Scanning electron microscopy
SUS-700
Hitachi
Obtaining the surface microstructure of the ceramics
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Spectrofluorometer
FS5
Edinburgh Instrument
Recording the upconversion luminescence spectra
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Ferroelectric analyzer
Premier II
Radiant Technologies
Recording the ferroelectric loops
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Impedance analyzer
4294A
Agilent
Testing the variation of dielectric performances with temperature
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Measuring system
PTS-2000H
Partulab
Testing the variation of dielectric performances with temperature
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Atomic force microscope
Cypher-HV
Asylum Research
Measuring the PFM study
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