研究目的
Investigating the synthesis, growth, and physicochemical properties of semi-organic nonlinear optical crystal: l-arginine sodium nitrate for its suitability in NLO devices.
研究成果
The LARSN crystal exhibits promising properties for NLO applications, including good optical transparency, thermal stability up to 150.8°C, SHG efficiency 0.49 times that of KDP, and low dielectric constant and loss at high frequencies. It is categorized as a hard material, making it suitable for photonics and opto-electronic device fabrication.
研究不足
The study focuses on the characterization of LARSN crystal properties but does not explore its application in specific devices or compare its performance with a wide range of other NLO materials.
1:Experimental Design and Method Selection:
The study employed slow evaporation solution growth technique for crystal growth, utilizing single crystal X-ray diffraction, FTIR spectroscopy, UV–Vis spectroscopy, TG/DTA analysis, Kurtz Perry powder SHG technique, Vicker’s microhardness test, and dielectric studies for characterization.
2:Sample Selection and Data Sources:
Stoichiometric amounts of l-arginine and sodium nitrate in double distilled water were used for crystal growth.
3:List of Experimental Equipment and Materials:
BRUKER KAPPA APEX II CCD diffractometer, PERKIN ELMER spectrometer, PERKIN ELMER LAMADA 35 spectrophotometer, NANO TECHNOLOGY-MODEL TG/DTA 6200 thermal analyser, Nd:YAG laser, SHIMADZU HMV microhardness tester, HIOKI 3532 LCR Hitester.
4:Experimental Procedures and Operational Workflow:
The mixture was stirred continuously for 12 h, filtered, and left for slow evaporation. Characterization techniques were applied to the grown crystal.
5:Data Analysis Methods:
Optical band gap energy was calculated using Tauc’s plot, SHG efficiency was compared with KDP, and dielectric properties were analyzed as a function of frequency.
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BRUKER KAPPA APEX II CCD diffractometer
KAPPA APEX II
BRUKER
Measuring cell dimensions of the crystal
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PERKIN ELMER LAMADA 35 spectrophotometer
LAMADA 35
PERKIN ELMER
Recording UV–Vis absorption spectrum
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SHIMADZU HMV microhardness tester
HMV
SHIMADZU
Analyzing mechanical property of the grown crystal
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PERKIN ELMER spectrometer
PERKIN ELMER
Recording Fourier transform infrared spectrum
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NANO TECHNOLOGY-MODEL TG/DTA 6200 thermal analyser
TG/DTA 6200
NANO TECHNOLOGY
Determining thermal stability
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Nd:YAG laser
Used in Kurtz Perry powder SHG technique
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HIOKI 3532 LCR Hitester
3532 LCR
HIOKI
Measuring dielectric loss and dielectric constant
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