研究目的
To investigate the intrinsic and extrinsic losses in low-loss dielectrics using terahertz time-domain spectroscopy and compare them with losses measured at microwave frequencies.
研究成果
THz-TDS can be used to estimate the intrinsic limit of dielectric loss for low absorption polycrystalline materials by reducing extrinsic contributions through appropriate synthesis methods and parameters.
研究不足
The study is limited to the characterization of CaSiO3, Zn2SiO4, and Mg2SiO4 ceramics and may not be applicable to other materials. The accuracy of the intrinsic loss estimation depends on the reduction of extrinsic losses through synthesis methods.
1：Experimental Design and Method Selection:
Terahertz time-domain spectroscopy (THz-TDS) was used to measure low-loss dielectrics in MMWs and submillimeter-waves.
2：Sample Selection and Data Sources:
CaSiO3, Zn2SiO4, and Mg2SiO4 ceramics with various microstructures were prepared using conventional ceramic technology.
3：List of Experimental Equipment and Materials:
Aispec IRS 2000 PRO spectrometer, TeraLyzer software (Menlo Systems GmbH), scanning electron microscopy, X-ray diffraction.
4：Experimental Procedures and Operational Workflow:
Samples were characterized in MWs with Hakki – Coleman and TE01δ Mode Dielectric Resonators methods. THz-TDS measurements were carried out in transmission set-up.
5：Data Analysis Methods:
Dielectric properties were extracted from time-domain data using TeraLyzer software.
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