研究目的
To present the traceable calibration of the detection efficiency of Si and InGaAs/InP single-photon avalanche detectors (SPADs) and describe the calibration facilities and the reference standard detectors used.
研究成果
The calibration of SPAD detectors' detection efficiency with a standard uncertainty of ≤ 1 % has been achieved, demonstrating the reliability of the quantum detection system. The study highlights the importance of traceable measurements for applications in quantum technology.
研究不足
The detection efficiency decreases significantly at high photon flux rates due to the dead time and reset time of the avalanche photodiode and the Poissonian photon statistics of the photons emitted from the laser source.
1：Experimental Design and Method Selection:
Two setups were established for the calibration of the detection efficiency of SPAD detectors, one with direct laser beam irradiation and another with fiber optic coupling. The detection efficiency is determined by comparing the photon rate measured with an analogue reference detector with those measured with the SPAD detector under test.
2：Sample Selection and Data Sources:
Si and InGaAs/InP SPAD detectors were used, with measurements taken at wavelengths of 850 nm and 1550 nm.
3：List of Experimental Equipment and Materials:
Equipment includes a low noise Si photodiode (Hamamatsu S1227 33BQ), an InGaAs photodiode (Hamamatsu G8605-23), and a Femto/Pico-ammeter (Keysight B2981A).
4：Experimental Procedures and Operational Workflow:
The laser source is attenuated to single-photon levels, and the photon flux is determined by multiplying the total transmission of the attenuators with the optical flux originating from the laser.
5：Data Analysis Methods:
The detection efficiency is analyzed as a function of count rate, with considerations for dead time, reset time, and Poissonian photon statistics.
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