研究目的
Investigating the uncertainty of the ohm using cryogenic and non-cryogenic bridges for resistance scaling and traceability to the SI ohm.
研究成果
DCC scaling results between the QHR standard and decade resistance values from 100 ? to 100 k? are compared to similar results from CCC measurements as a preliminary study of DCC suitability for traceability of the ohm based on the QHR. Relative uncertainties are estimated from these results.
研究不足
Room-temperature bridge systems cannot achieve the sensitivity offered by high-turns CCC bridges, and achieving an acceptable uncertainty level may be difficult when scaling with a QHR standard. Higher current levels may introduce unwanted power dissipation or resistance breakdown in the QHR device.
1：Experimental Design and Method Selection:
The study compares cryogenic current comparator (CCC) and direct current comparator (DCC) bridges for resistance scaling.
2：Sample Selection and Data Sources:
Uses a bank of five 100 ? standards and several CCC bridges, including a commercial system with binary windings and a wideband superconducting quantum interference device (SQUID) feedback.
3：List of Experimental Equipment and Materials:
Includes CCC bridges, DCC bridges, standard resistors, and graphene QHR devices.
4：Experimental Procedures and Operational Workflow:
Involves direct comparisons between resistance standards and QHR devices, with measurements taken at various current levels and durations.
5：Data Analysis Methods:
Standard deviation of repeated measurement sets under similar conditions is used to derive type A uncertainty.
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