研究目的
To describe a simple calibration method for nanovoltmeters that allows the determination and correction of gain errors for the microvolt and nanovolt ranges, providing real traceability to low level voltage measurements and a realistic estimation of the measurement uncertainty associated to the gain errors of nanovoltmeters.
研究成果
The described system allows the calibration of nanovoltmeters in the nanovolt and microvolt ranges with low noise and thermal stability, enabling nanovoltmeter gain estimation with a relative combined uncertainty of 50 x 10-6 in the 1 to 10 microvolt interval and 0.6 % in the 10 to 100 nanovolt interval. The calibration permits an effective error correction, demonstrating its utility for high accuracy DC voltage measurements.
研究不足
The method requires thermal stability in the measurement system to stabilize thermal electromotive forces, necessitating controlled laboratory conditions and clean copper contacts. The noise behavior of the system also limits the averaging time for measurements.
