研究目的
Investigating the formation of urethane bonds at the Polycarbonate (PC) –Octadecylamine (ODA) interface using surface enhanced Raman scattering (SERS) spectroscopy.
研究成果
The study successfully demonstrated the in-situ identification of urethane groups as linkers between PC and ODA using SERS spectroscopy. The technique provides molecular information from the interfacial layer without destroying the composite, offering insights into the chemical reaction across a polymer-polymer interface.
研究不足
The use of SERS for characterization of interfacial layers is influenced by the layer of Ag nanoparticles, which may hinder an extensive reaction between PC and ODA. Additionally, the signals of reaction products are expected to be weak.
1:Experimental Design and Method Selection:
The study employs SERS spectroscopy for in-situ evaluation of the PC-ODA interface to identify urethane bond formation.
2:Sample Selection and Data Sources:
PC and ODA were chosen as materials to probe molecular linkage processes.
3:List of Experimental Equipment and Materials:
Includes Makrolon 2245, ODA, silver nanoparticles, and various solvents.
4:Experimental Procedures and Operational Workflow:
Involves sample preparation with spin coating, silver vapor deposition, and thermal treatment to initiate interfacial reaction.
5:Data Analysis Methods:
Raman and SERS spectra were analyzed using Matlab for spectral evaluation.
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Makrolon 2245
Bayer
Used as a material in the study for its properties in polymer composites.
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ODA
Sigma Aldrich
Used as a polyamine to probe molecular linkage processes with PC.
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silver
Sigma Aldrich
Used to create nanoparticles for SERS spectroscopy.
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inVia spectrometer
Renishaw
Used for recording Raman and SERS spectra.
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diode laser
Used as a light source for Raman spectroscopy.
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Leica microscope
Leica
Used to focus the laser beam on the sample surface.
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CCD camera
Used for detecting Raman signals.
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Matlab
Version 7.0
Math Works Inc.
Used for analyzing Raman and SERS spectra.
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Dimension Icon
Bruker-Nano
Used for atomic force microscopy measurements.
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silicon nitride cantilever
Used in AFM measurements.
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Cary 100 spectrometer
Agilent
Used for UV–vis spectroscopy.
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Libra200MS
Carl Zeiss
Used for transmission electron microscopy.
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